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1 article(s) from Dvořák, Filip

Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere

Petr Knotek,
Tomáš Plecháček,
Jan Smolík,
Petr Kutálek,
Filip Dvořák,
Milan Vlček,
Jiří Navrátil and
Čestmír Drašar

Beilstein J. Nanotechnol. 2019, 10, 1401–1411, doi:10.3762/bjnano.10.138

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Figure 1: (A) Topographical and (B) phase-shift image, and (C) surface contact potential map of Au nanopartic...

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Figure 2: (A, B) Determination of the surface contact potential decrease and the height of the Au NPs; (C) su...

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Figure 3: Single-point I–V curves performed during the mechanical contact with the Pt-coated conductive tip o...

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Figure 4: (A) Change of the I–V characteristics for ten repetitions of a single-point and (B) induced changes...

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Figure 5: (A) SEM image of the Au layer (33 nm in thickness) on Bi₂Se₃ irradiated by the electron beam for di...

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Figure 6: Maps of the surface contact potential measured by means of KPFM for the e-beam formed NIs on the Au...

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Figure 7: (A) Topographical and (B) surface contact potential profiles of the 9 nm irradiated Mo layer; maps ...

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Figure 8: UPS data for Bi₂Se₃; Mo or Au layers on the top of the Bi₂Se₃ cleaned by the Ar⁺ sputtering excited...

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Figure 9: (A) Changes of the surface potential in the pattern after UV photodiffusion of Au (20 nm) into Bi₂Se...

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Published 15 Jul 2019

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